News

Quality control system for advanced materials producers and users

Monday, 22 June 2026

The exceptional properties of advanced materials can enhance a wide range of products. However, the uniqueness of each material poses analytical inspection challenges for manufacturers and users alike.

Ensuring consistency of material characteristics in development and ramp-up phases and maintaining set quality control levels in mass production require a multitude of approaches.

Stat Peel’s Identifier Q system is a further development of the original Identifier, which is a high-sensitivity Raman spectroscopy instrument used to monitor exposure and contamination. The Identifier Q allows the automated inspection of up to 180 material samples at the shop floor to ensure full traceability of materials produced or products received.

Update NEC Conference data

By clickinhg on the buttons below you will be updating the NEC Conference data!
This will start the API call to the EP : HUB site to gather the data.

Note : The process can take a few moments to action!
So ONLY PRESS A BUTTON ONCE.

Update NEC Conference data is for updating the Conference Session data


Run Speaker House Keeping is for updating Speaker data


When the API call is complete and the data has been updated, the web page will refresh.